Showing results: 571 - 585 of 876 items found.
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Iwasaki Electric Co., Ltd.
Whatever your application, from an environmental chamber for small components to an extensive array for a complete automobile or aircraft test, EYE / Iwasaki has the experience to provide a solar lighting system customized for your requirements. Our systems are designed to be flexible and deliver the optimum solar simulation solution. We do not force-fit a "standard" system to attempt to meet your needs.
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FloTHERM -
Mentor Graphics Corp.
Perform thermal analysis, create virtual models, and test design modifications of electronic equipment before physical prototyping. FloTHERM uses advanced CFD techniques to predict airflow, temperature, and heat transfer in components, boards, and complete systems, including racks and data centers. It''s also the industry''s best solution for integration with MCAD and EDA software.
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SCR ELEKTRONIKS
The HWI test indicates a materials resistance to ignition when exposed to abnormally high temperatures resulting from a component failure such as a conductor carrying far more than its rated current. HWI performance is expressed as the mean number of seconds required to ignite a specimen when wrapped with an energized non-chrome resistive wire that dissipates a specified level of energy.
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TOELLNER-wavecontrol -
Toellner Electronic Instrumente GmbH
The Software TOELLNER-WaveControl provides waveforms and controls the TOELLNER system components at the test station, which can be individually tailored to your requirements. Using a DAQ-Card, any signal waveform can be provided with Arbitrary Power Supplies or 4-Quadrant Amplifiers with outputs from 160 W to 5200 W. For fast interruptions, TOELLNER offers electronic switches with switching times below 500 ns.
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3270 Series （350V,1875W~22500W） -
PRODIGIT Electronics Co, Ltd.
3270 Series is suitable for the step, square and sine wave of the AC Power device test, especially for the uninterruptible power supply UPS, Inverter, fuses, circuit breakers, power regulator AVR, battery, AC / DC power supply / components ... and so on, absolutely is the best test solution in the market.
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7Layers, Inc.
Electromagnetic compatibility (EMC) must be demonstrated for all devices with integrated radio components for approval in almost every country in the world. EMC tests examine whether the electromagnetic emissions from your product are within the specified limits and whether your product and its functionalities themselves are not negatively influenced by electromagnetic emissions. We offer EMC tests for modules and end products with integrated radio technology as well as IT and IoT products. Our accredited EMC test laboratories are equipped to test almost all modern radio technologies, and our EMC experts have many years of experience in this area. With us, your modern radio products are on the safe path to the global market.
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JL-XC -
Lisun Electronics Inc.
JL-XC series waterproof test chamber is mainly used for small electronic and electrical products. Such as lamps, electrical cabinets, electrical components and so one. The products are tested for physical and other related properties under simulated climatic conditions. After the test, it is judged whether the performance of the product meets the requirements by verification, so as to be used in the design, improvement, verification and factory inspection of the product. Comply with IEC60529:2001 《Degrees of protection provided by enclosures (IP Code)》, GB4208-2008 《Shell Protection Grade (IP Code)》 14.2.8 Terms and GB7000.1 《Lamps Part 1: General Requirements and Tests》 9.2.9 Terms.
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Crystal instruments
Automated production testing is critical in today’s competitive manufacturing environment. Companies can no longer rely on variable costs, non-uniformity, and potential health hazards that come with a laborer-based manufacturing line. This is no less true for sound and vibration tests, ranging from in-process burn-in tests to product validation and verification tests. The measurement tools and intelligence behind present day manufacturing include data acquisition equipment as well as closed-loop control. And while these systems may not take part in the assembly of any goods, they are just as important to ensure quality control for both components coming into an assembly line and products going out.
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2811 LP -
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● Displays and sound warning if external voltage present.● Displays mains voltage, scroll trough menus.● Checks wiring integrity (LEDs and display).● Single button operation.● Auto-off/auto-ranging.● Combined prospective short circuit current, PSC and LOOP tester.● Built-in carry case, test leads in separate pouch.● Loop test for L-E and L-N and PSC.● Voltage test L-N and L-E.● Enables analysis of constituent components in L-E and L-N loops giving resistance of earth, neutral wire, live wire and transformer winding.● Display can be customized for special orders.● 60Hz available on request.
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µModule® -
Analog Devices Inc.
Analog Devices µModule® (micromodule) receivers consist of high performance, high speed ADCs with fixed-gain, high speed amplifiers and antialias filters. Our integrated ADC and driver products include integrated bypass capacitance and simplify the high frequency layout required to preserve ac performance. The board space savings are significant for instrumentation applications such as spectrum analyzers, oscilloscopes ,and communications test equipment, or for communications applications such as high sensitivity receivers, software-defined radio (SDR), or signal intelligence receivers. Our portfolio uses system-in-package (SiP) technology similar to multichip modules (MCM) to integrate components with different technologies, along with passive components to make an integrated subsystem.
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Teledyne LeCroy
Gen-Z is a data-access technology designed to provide high-speed, low-latency, memory-semantic access to data and devices via direct-attached, switched or fabric topologies. Gen-Z components use low-latency read and write operations to directly access data and use a variety of advanced operations to move data with minimal application or processor involvement. Gen-Z fabric utilizes memory-semantic communications to move data between memories on different components with minimal overhead. Memory-semantic communications are extremely efficient and simple, which is critical to delivering optimal performance and power consumption. Teledyne LeCroy provides protocol analysis and error injection test equipment to support development and debug of Gen-Z based devices
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UI2001B -
Lisun Electronics Inc.
• Measure input parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components. V range: 10.0~300.0V, A range: 0.010~2.000A, F range: 45~65Hz • Measure output parameters: Vrms, lrms, W, PF, Hz, current crest factor, total harmonic and 0~50th harmonic components Lamp voltage range: 10.0~450.0V, Lamp current range: 0.010~2.000A • Accuracy: ± (0.4% reading+0.1% range+1 digit) • Can test every kind of curve, print both data & curve • Communication interface available for PC, running under Windows98/2000/XP/Vista
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Protector Adjustable Family -
Test Electronics
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Protector Press Rods Family -
Test Electronics
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Fivestar HV Testing Equipment Co., Ltd.
HV DC voltage generators are used to generate high voltage DC test voltages for routine, type and development test on components and complete systems found in electrical power supply systems and operating on DC voltage (HV transmission systems etc). There are K and M series, and available for indoor and outdoor.
